System for Automated Performance Assessment of Perovskite-based Optoelectronic Devices (No. 104)

 
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Summary

A novel system for assessing the performance and quality of perovskite used in solar cells or other semiconductor devices.

The global perovskite market size is over 450 million USD and is expected to grow at a CAGR of 30.8%. Perovskites are at the forefront of materials research because of their wide range of potential applications including solar cells, LED lights, display screens, memory devices (RAM), lasers, batteries and photodetectors. To ensure perovskite-based devices are of high quality and have optimized Power Conversion Efficiency (PCE), performance evaluations need to be conducted. However, perovskite has problems with current-voltage (I-V) hysteresis when measured by scanning voltage. Such hysteresis effects give rise to concerns revolving around the quality and accuracy of reported efficiency values in the past, thereby to the need for better practices than conventional ones for measuring and reporting perovskite quality and performances. Here, we present a promising performance assessment system developed by a group of researchers led by Prof. Yabing Qi. The developed system provides a fully automated and reliable measurements of perovskite quality and PCE.

 

Lead Researcher:
Yabing Qi

Faculty of Energy Materials and Surface Sciences Unit

Applications

  • Solar Cell
  • Batteries
  • Semiconductor Devices (LED, memory, photodetector)

 

Advantages

  • Automated
  • Reliable
  • Rapid testing

   

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Technology

The technology is based on a system for assessing quality and performance of perovskite modules. Specifically, the system includes a chamber housing a perovskite module holder that is sealed with a window. A light source emits light that enters the chamber through the window to shine on the perovskite modules. Also included is a switch board coupled to the device holder for allowing selection of a perovskite module for measurement. A DC voltage supply is coupled to the switch board to apply voltage to the selected perovskite module. Finally, a source/measure unit (SMU) is coupled to the switch board for measuring the current of the perovskite module and I-V software analyzes the hysteresis behavior before calculating the PCE.

 

Media Coverage and Presentations

 JST Technology Showcase Presentation (JP Only)

 JST Technology Showcase Presentation Slides (JP/EN)

 

CONTACT FOR MORE INFORMATION

  Graham Garner
Technology Licensing Section

  tls@oist.jp
  +81(0)98-966-8937