Electron Microscopy
Contact point for usage through "Jumps" program
Imaging Section (IMG-request*oist.jp) (replace* by @)
Atomic Resolution Analytical Transmission Electron Microscope
Manufacturer: JEOL
Model: JEM-ARM200F
Features:
Acc. Voltage: 200 keV
A device capable of observing atoms with high resolution, TEM mode and STEM mode (with Cs correction function), an EDX detector and an EELS detector. (Scanning resolution: 0.078 nm)
Scanning Electron Microscope (SEM)
Manufacturer: JEOL
Model: JSM-7900F
Features:
EDX
EBSD
Cryo-Transmission Electron Microscope
Manufacturer: Thermo Fisher Scientific
Model: Titan Krios
Features:
Acc. Voltage: 300 keV
Holder:
Cryo-stage/Autoloader plan 3
Camera:
FEI Falcon 3EC, FEI Ceta camera, Gatan energy filter with Gatan K2
Software:
EPU automated data acquisition software, TEM/STEM Tomography software, SerialEM, Leginon
Other equipments:
Phase plate, STEM (BF/DF/HAADF detector)
Cryo-Transmission Electron Microscope
Manufacturer: Thermo Fisher Scientific
Model: Talos Arctica
Features:
Acc. Voltage: 200 keV
Holder:
Cryo-stage/Autoloader plan 3
Camera:
FEI Falcon 3EC, FEI Ceta camera
Software:
EPU automated data acquisition software, TEM/STEM Tomography software, SerialEM, Leginon
Cryo-Transmission Electron Microscope
Manufacturer: Thermo Fisher Scientific
Model: Talos L120C
Features:
Acc. Voltage：120 keV
Holder:
Single-tilt holder, high-field-of-view tomography holder, cryo-holder (Fischione, Model 2550)
Camera:
FEI Ceta camera
Software:
EPU automated data acquisition software, TEM Tomography software, SerialEM
Serial Block-Face Scanning Electron Microscope (SBEM)
Manufacturer: Thermo Fisher Scientific
Model: Teneo-VS
Features:
The Teneo has a build-in microtome that allows the removal of a thin layer of resin with subsequent imaging of the remaining block-face to acquire high-resolution data of large volumes. Generally the volumes are larger and the resolution is lower that with a FIB-SEM.
This SEM can also be used for array tomography.
Transmission Electron Microscope (TEM)
Manufacturer: JEOL
Model: JEM-1230R
Features:
Acc. Voltage: 100 keV
An electron microscope that uses a beam of electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects.(Resolution: 0.2 nm)
Focused Ion Beam / Scanning Electron Microscope (FIB-SEM)
Manufacturer: Thermo Fisher Scientific
Model: Helios NanoLab 650
Features:
The Helios is equipped with a dual beam system: a focused gallium ion beam (FIB) for sample processing and an electron beam (SEM) for simultaneous imaging.
Our system is mainly used for FIB-SEM tomography of resin embedded biological samples.
A cryo-stage from Quorum Company, UK, allows to process and image cryo-samples.