Electron Microscopy


Contact point for usage through "Jumps" program

Imaging Section (IMG-request*oist.jp) (replace* by @)

 

Atomic resolution analytical transmission electron microscope
Maker: JEOL
Model: JEM-ARM200F

Features:

A device capable of observing atoms with high resolution,  TEM mode and STEM mode (with Cs correction function), an EDX detector and an EELS detector. (Scanning resolution: 0.078nm)

Scanning electron microscope
Maker: JEOL
Model: JSM-7900F

Features:

 

Cryo transmission electron microscope
Maker: Thermo Fisher Scientific
Model: Titan Krios

Features:

Acc. Voltage:300V

Holder:Cryo stage/Autoloader plan 3

Camera:FEI Falcon 3EC, FEI Ceta camera, Gatan energy filter with Gatan K2

Software:EPU automated data acquisition software, TEM/STEM Tomography software,  (Additional) SerialEM, Leginon​

Other equipments: Phase plate, STEM (BF/DF/HAADF detector)

Cryo transmission electron microscope
Maker: Thermo Fisher Scientific
Model: Talos Arctica

Features:

Acc. Voltage:200V

Holder:Cryo stage/Autoloader plan 3

Camera:FEI Falcon 3EC, FEI Ceta camera

Software:EPU automated data acquisition software, TEM/STEM Tomography software,  (Additional) SerialEM, Leginon

Cryo transmission electron microscope
Maker: Thermo Fisher Scientific
Model: Talos L120C

Acc. Voltage:120kV

Holder:Single-tilt holder, High-field-of-view tomography holder, Cryo transfer Holder (Fischione Model2550)

Camera:FEI Ceta camera

Software:EPU automated data acquisition software, TEM Tomography software

 

 

Serial block-face scanning electron microscope
Maker: FEI
Model: Teneo-VS

Features:

This SEM has an automated ultra-microtome in the specimen chamber for taking images of serial sections. This device is a powerful 3D imaging tool which is applicable on larger sample than FIB/SEM. 

Transmission Electron microscope
Maker: JEOL
Model: JEM-1230R

Features:

An electron microscope that uses a beam of electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects.(Resolution: 0.2nm)

Focused ion beam / scanning electron microscope
Maker: FEI
Model: Helios NanoLab 650

Features:

The focused ion beam (FIB) apparatus is a device that irradiates a focused ion beam of gallium to a sample to process. simultaneously This is a dual beam device of FIB and  electron (SEM) which enables imaging while processing. This device is used for 3D imaging as well. With a cryo stage, frozen specimens are also applicable.