Hybrid-Pixel Detectors for Electron Microscopy

Abstract: Hybrid-pixel detectors have revolutionized electron microscopy by combining direct detection with noise-free readout and single-electron sensitivity. This technology enables ultrafast 4D STEM at 120,000 frames per second and high-resolution EELS, allowing for the visualization of beam-sensitive materials and complex magnetic domains. By integrating high dynamic range with radiation-hard designs, Hybrid-pixel detectors bridge the gap between traditional imaging and advanced diffraction analysis to empower breakthroughs in materials science and structural biology.

Speaker: Dr. Luca Piazza, Electron Microscopy Product Manager from Dectris Ltd.