Technical Seminar: Introducing New Technologies and System for AFM for Life Science

Imaging & Instrumental Analysis Section would like to invite you to a presentation by JEOL:

14:30 - 15:30 Presentation

15:30 - 16:00 Q&A / Discussion

Topics

1. Introduction of new non-contact topographic measurement mode (SICM) to solve issues of AFM measurement technology in fluid for bio application              

 *SICM (Scanning Ion Conductance Microscope)

2.Introduction of the accurate AFM to fundamentally solve key issues on existing AFMs for materials or devices

3. Introduction of new AFM operating software revolutionarily improved the ease of use together with its high quality of the data