[Seminar] Present status and future prospects of advanced transmission electron microscopy for nanomaterials by Prof. Nobuo Tanaka, Nagoya University

Date: 11 September 2017
Time: 16:00 - 17:00
Venue: C700, Lab 3 Level C => C209 Level C, Centre Bldg. 

Speaker: Dr. Nobuo Tanaka, Professor at Institute for materials and systems for sustainability, Nagoya University
Title: Present status and future prospects of advanced transmission electron microscopy for nanomaterials.

Abstract: Since the beginning of the 21 century, electron microscopy has experienced a kind of revolution¹⁾ such as development of (1)aberration correction of electromagnetic lenses for imaging atomic structures by scanning transmission electron microscopy(STEM)^2,3) and conventional TEM^3,4), (2)brighter and coherent electron sources, (3)3D electron tomography^2,3), and (4)analytical capability of elements, electronic structures and lattice vibrations by electron energy loss spectroscopy (EELS)^5,6), and (5) in-situ observation techniques in gas^7,9) and liquid-atmospheres⁸⁾. With the development, details of environmental and energy-related materials such as catalysts and innovative oxides, have been analyzed in more practical viewpoints.

In the present talk, the author reviews typical achievements on advanced electron microscopy around him and discusses about the future prospects of electron microscopy^1,2,3), where the microscope becomes an almighty tool for advanced materials by overcoming some disadvantages involved previously. Finally, recent development of a new environmental high-voltage electron microscope⁹⁾ and a spin-polarized/pulsed TEM¹⁰⁾ is explained briefly.

 References
1)N. Tanaka, Science & Technology of Advanced Materials, 9(2008), 014111.
2)N. Tanaka, "Scanning Transmission Electron Microscopy of Nanomaterials" (Imperial College Press, 2015). 
3)N. Tanaka, "Electron Nano-imaging" (Springer, 2017)
4)N. Tanaka, in “Advances in Imaging and Electron Physics” (Academic Press, 2008).
5)R.F. Egerton, “Electron Energy Loss Spectroscopy in TEM” (Plenum Press, 1996).
6)O.L. Krivanek et al., Microscopy, 62(2013), 3.
7)P.L. Gai, “In-situ Electron Microscopy in Heterogeneous Catalysis” (Institute of Physics Publishing, 2003).
8)H. Zheng et al., Science, 324(2009), 1309.
9)N. Tanaka et al., Microscopy, 62(2013), 205.
10)M. Kuwahara et al., Appl. Phys. Lett., 101(2012), 033102.