LEEM / PEEM
In the Femtosecond Spectroscopy Unit, we aim to combine time resolution of ultrafast optical technique with spatial resolution of an electron microscope to study spatially resolved ultrafast electronics processes at the femtosecond timescale. For this purpose, our unit is equipped with a low-energy/photo-emission electron microscope (LEEM/PEEM) and several high power femtosecond lasers. LEEM/PEEM is a powerful and versatile technique that utilizes a range of complementary analysis methods to characterize 2D materials, inhomogeneous surfaces, ultrathin films and buried interfaces. To enable visualization of magnetic nanomaterials, we use photo-emitted electrons generated by a femtosecond laser to provide time resolution at ultrafast timescale, and meanwhile the electron microscope with give us spatial resolution at the nanometer range. Spatial visualization of the electronics dynamic processes at their fundamental time and length scale will help advance our understanding in the physics processes behind the emerging nanotechnologies.
- Highest spatial resolution (< 8 nm for LEEM; < 30 nm for PEEM)
- Highest energy resolution (< 150 meV)
- Operation modes:
- PEEM: Photoemission Electron Microscopy
- PES: Photoemission Spectroscopy
- µ-ARPES: micro-Angle Resolved Photoemission Spectroscopy (< 1 µm)
- LEEM: Low Energy Electron Microscopy
- MEM: Mirror Energy Microscopy
- TEEM: Thermionic Emission Electron Microscopy
- µ-LEED: micro-Low Energy Electron Diffraction (< 250 nm)
- µ-EELS: micro-Electron Energy Loss Spectroscopy (< 250 nm)
- Sample temperature range (~100 K to 1800 K)
- UHB in-situ monitoring of dynamic processes such as crystal growth or phase transition
Page last updated on August 30, 2017 (MM/CP).